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Emitter improve the accuracy of dynamic target test

After repeated experiments and theoretical analysis and comparison, the root of the problem really lies in the manuscript the date of receipt: 99 for a fan to a 28 n, F, 38, engineer on the No. 3 of 2000 physical testing DA-16 type crystal form had mV ( existing equipment in the laboratory a high internal resistance) and resistance is not high enough,[link widoczny dla zalogowanych], the analysis is as follows: the passage of test results and the theoretical value of 1 emitter small-signal dynamic target test micro-dependent equivalent circuit shown in Figure 2 instructions. No. 2 through the quiet little sleet to the equivalent circuit voltage gain of the theoretical value should be: J4 = Vo = (1 + #) R, / / RL ≤ 1 when the actual test voltage mV, respectively, table and one input and output loop measured input and output voltage of the RMS can be. So that measuring the input voltage (source voltage must) put mV meter shunt resistance R in the input circuit, the measured input voltage is no longer a voltage meter is not, and before the people;. . Flowers (1) where rj is emitter input resistance. r. = Rb / / [k + (1 + port) R / / RL] become: Comparison of high-s v (1) and (2), can be found Vi ' 1 a. (Continued on page 40) on the physical test 2O00 3 (2) as soon as possible from the metal matrix, loading rate, environmental temperature,[link widoczny dla zalogowanych], environmental media, sampling location and sample size and precision machining make uniform provisions, the use of fractal Technology such as the establishment of metal tensile specimen fracture analysis methods and evaluation criteria to ensure that the metal tensile specimen fracture analysis of the comparability and accuracy. References l Chiang * silk, CUI Malone pry. Physical copies of a boat TESTING, 199o. 26 (3): 232 in the kit. Barrier drug Hao, Zhang cooking and so on. TESTING - Yun Li Zhou copies. 1993,29 (3j: 18 one plus 3 TESTING. TESTING - Yun Li volumes, 1994. Canada (5) :33 - 354 Su chaff. Tien Cong, Cambodia Qi hygiene. Barrier ■ Heat .199 ~ (2) : 19 ~ 5 risk of Huang, Huang Baiyun, Lv Hai-slope. bad rule base beam technology .1996.14 (1): 37 ~ 436 Gerong Lei, Wang disc new. Gan,[link widoczny dla zalogowanych], and afraid. .1995,19 Mechanical Engineering (3): 32 ~ 357 Paul Shen. renovating early. ml Ji Qian. special genetic and non-ferrous casting platform barrier .1999 (1): 21 ~ 228 Yin safety. Han hide the wind, Cao Gu ■ and so on. base of a product .1998,24 (5): 6 ~ l09 Ling Shushou. Physical control inspection - Yun Li Dan volumes .1994, Canada (1): 56l0 Ji Ming meaning. Dan Leike. base Zhihao. base of a mechanical properties. Xi'an: Xi'an University Press .1986:36 modifications - -39,52 - 55 children dip the foot. barrier ■ clarity of the text attributed to capsule. Beijing: Public Health and published in the rule base Mu .1978:169 l2P. bend ∞ black. Tram .. 1994.32:553 l3 sin grinding cylinder. Dingyi Kun. box of a product .1998.24 (6): 38 ~ 4o14 Cuilian Cheng. plus commitments Shao. physicochemical hit in a reasonable volumes .1983, l9 (4): 51 ~ 52l5 Yu Mi capsule. Physical column hopane - Li Zhou temporary copies. 1996,32 (5): 62l6 Society of the United States ■ Velvet barrier. base of a Manual (Ninth Edition,[link widoczny dla zalogowanych], the eighth spring). Beijing: Mechanical Engineering leek out quite Du .1994: Introduction l7 ben good people. Physical pull test - Qu Li Zhou List .1983.19 (5) :44-4518GB6397-86-base ll try a pull distressed sample (on the next page 45) to identify the source of the problem, will find a solution to the problem, namely the use of higher The voltage meter to measure resistance. Since there is no higher resistance of the voltage lab table, we will use with l: l0 attenuation of high resistance (1OMb'1) dual-trace device to grab I show the amount of transition. The same circuit parameters and test conditions, the test results shown in Table 2. Ai Xiao 2 double the provision of oscilloscope test results showed wilted, the test is close to the theoretical value, increase the test emitter accuracy of dynamic targets to solve the emitter voltage amplification factor is greater than l the problem. Reference 1 Kanghua Guang Wen He main weight. electricity in technology infrastructure. Beijing: Higher Education Publishing Wang Lan Du .19932. Du Xiao said the nature of law and uncle ■ ● induced resistance. Electrotechnical .19 (3)

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